How Custom CMOS Image Sensors Enable Extreme Low-Light Imaging Applications: Part I
While both image intensifier (II) and electron-multiplying charge-coupled device (EMCCD) technologies have historically dominated extreme low-light imaging applications, their performance is limited by noise, dynamic range and single-photon sensitivity.
09/09/2024
Analyzing and Simulating Low-light Nonlinearity in CMOS Image Sensors
With the number of analog to digital converters (ADC) increasing to read larger pixel arrays at higher frame rates, disturbances on shared nets can cause nonlinearity.
02/13/2024
A Simulation Testbench For Predicting Nonlinearity in ADC Arrays
In our last two blog posts, we explored sources of low-light nonlinearity (INL) in CMOS sensors, along with some solutions to reduce the disturbances. To test these approaches, we’ve developed a simulation methodology to predict the low-light INL in an ADC array.
02/13/2024
Exploring Sources of Low-light Nonlinearity in CMOS Sensors
In a single-slope architecture, analog to digital converters (ADCs) have some shared common nets, including supplies, grounds, biases and ramp. A larger number of ADCs converting at the same time can cause kickback on these shared nets, leading to nonidealities — one of which is integrated nonlinearity (INL).
02/13/2024